iaver = icγc - iaγa (3)
Just as there are infinite combinations of height, width and length to obtain a given volume, in pulse and pulse reverse processes there are unlimited combinations of peak current densities, duty cycles and frequencies to obtain a given electrodeposition rate. By controlling the cathodic on-time, anodic on-time, relaxation-time and the cathodic and anodic peak currents, precise control of the electrodeposition process is achieved and consequently the properties of the resulting deposit may be controlled or fine-tuned for a specific application. In conventional direct current (DC) electrodeposition, the current is turned on and held for the duration of the process. By interrupting this constant stream of current, as in the pulse / pulse reverse process, one may achieve results not possible with conventional DC electroplating, such as deposit property control and elimination of adverse side reactions, such as hydrogen evolution, which may become co-deposited with chromium, affecting the nature of the electrodeposit and resulting in samples with inadequate wear properties.
Elimination of hydrogen
Pulse / pulse reverse plating can be used to reduce the amount of H2inclusion in the coating. This section further explains how H2 can be incorporated in the coating and discusses how the density of these inclusions can be mitigated. The evolution of hydrogen during a metal deposition process results in a low current efficiency and a high power consumption. In addition, hydrogen evolution during metal deposition leads to hydrogen embrittlement in the substrate or hydrogen bubble inclusion in the metal deposit. This adversely affects the electrodeposit in terms of:
1. Low corrosion resistance,
2. Poor adhesion to the substrate,
3. High internal stress and
4. Excess porosity.
By properly adjusting the electrically-mediated parameters, one can alter the kinetics of both the metal deposition and hydrogen evolution reactions. While reaction kinetics can be modified using an electrically-mediated waveform with only a forward modulation, hydrogen bubbles adsorbed on the electrode surface can be released during the off-time period. By using an electrically-mediated waveform with a reverse modulation, one can “tune” the anodic or reverse part of the waveform to consume the nascent hydrogen according to the following reaction:
H2 → 2H+ + 2e- (4)
In this manner, a low pH is maintained and chromic hydroxide precipitation is avoided. Furthermore, hydrogen is not permitted to diffuse into the substrate or be incorporated in the deposit. Finally, by compensating for the anodic current with an increased cathodic current, the overall electrodeposition rate is maintained and the net current efficiency is improved.
Mass transfer
The ability of pulse / pulse reverse waveforms to increase mass transfer to and from the surface during deposition is essential to producing a coating whose properties contain minimal side products, for instance H2 bubble inclusion which for chromium reduces its wear resistance and adhesion. Mass transport in the pulse reverse process is a combination of steady state and non-steady state diffusion processes. The mass transfer limited current density (il) is related to the reactant concentration gradient (Cb - Cs) and to the diffusion layer thickness (δ) by the following equation:
(5)
Cheh and coworkers15,16 discussed the theory of mass transport with respect to pulse electrolysis. In steady state DC electrolysis, δ is a time-invariant quantity for a given electrode geometry and hydrodynamics. In pulse and pulse reverse electrolysis, however, δ varies from 0 at the beginning of the pulse to its steady state value when the Nernst diffusion layer is fully established. The corresponding diffusion limiting current density would then be equal to an infinite value at t = 0 and decreases to a steady state value of the DC limiting current density. The advantage of pulse and pulse reverse electrolysis is that the current can be interrupted before δ has a chance to reach the steady-state value. This allows the reacting ions to diffuse back to the electrode surface and replenish the surface concentration to its original value before the next current interruption. Therefore, the concentration of reacting species in the vicinity of the electrode pulsates with the frequency of the modulation.
Under pulse electrolysis, Ibl and colleagues17,18,19 proposed a “duplex diffusion layer” consisting of a pulsating layer, δp, and a stationary layer,δs. Modeling work by Landolt has also suggested the existence of a pulsating diffusion layer.20 Since the thickness of the pulsating diffusion layer is determined by the waveform parameters, we call this layer the “electrodynamic diffusion layer”(Fig. 2).21 By assuming a linear concentration gradient across the pulsating diffusion layer and conducting a mass balance, Ibl derived the pulsating diffusion layer thickness (δp) as:18
δp= (2Dton)1/2 (6)
and when the pulse on-time is equal to the transition time, τ, the concentration of reacting species at the interface drops to zero precisely at the end of the pulse:
(7)
More exact solutions are given by integrating Fick’s diffusion equation:
(8)
(9)
More recently, Yin,22 using a similar approach as Ibl, derived the same equation for the pulsating diffusion layer for “pulse-with-reverse” plating.
The key points to consider for development of a pulse / pulse reverse manufacturing process for deposition of functional chromium include (1) the electrodynamic diffusion layer thickness is proportional to the pulse on-time, and (2) the transition time is inversely proportional to the current.
Prior work on functional Cr(III) plating
In previously reported work we accomplished the following milestones:
· Plated from a trivalent chromium sulfate bath where the consumable was in the price range of chromic acid,23
· Simplified the bath chemistry using an electrically-mediated waveform,23
· Increased the chromium plating thickness to 250 μm,23
· Maintained a plating rate similar to that of hexavalent chromium,23
· Determined the maximum diffusion layer thickness for plating from a trivalent chromium sulfate bath,24
· Determined the acceptable range for achieving bright plating,24
· Replated chromium on chromium,24
· Displayed superior corrosion resistance compared to laser-coated surfaces,25
· Achieved a suitable chromium distribution for pump rotor wear tests at a manufacturer,26
· Achieved equal or better wear resistance compared to a Cr(VI) deposit against hardened steel,26
· Produced a similar micro-hardness to that of Cr(VI) deposits and
· Developed a technique to deposit thick chromium up to 500 μm (20 mils) with minimal cracking by sequencing the electrical-mediation process parameters (Figure 3 demonstrates the looping behavior on the chromium deposit.).
Current work on functional Cr(III) plating
The current program is set to validate the functionality of the chromium deposits produced by the sequenced pulse / pulse reverse process and a Cr(III) bath. The evaluation criteria include:
· Thickness per AMS 2460, 3.4.1
· Porosity per AMS 2460, 3.4.4
· Adhesion per AMS 2460, 3.4.2
· Surface roughness and morphology
· H2 embrittlement per ASTM F519
· Hardness AMS 2460, 3.4.3
· Corrosion resistance per ASTM B519 (Salt Spray)
· Wear
o Taber Abrasion per ASTM D4060
o Ball on Disc per ASTM G133
o Oscillation
· Amp-hr solution analysis for Cr(VI)
· Fatigue axial tension per ASTM E466 and ASTM E468
· Rotating beam tests per ISO 1143 and ASTM E468.
Results
Effect of surface pretreatments
The initial hurdle overcome by the programs was the development of a surface preparation process that was used to increase coating adhesion (AMS 2460 3.4.2, Bend to Break Test) while minimizing the porosity (AMS 2460, 3.4.4, Ferroxyl Test). The factors examined for this analysis included anodic electrocleaning, grit blast particle size (54, 120, and 220), H2SO4/HF anodic etch, post bake and reverse etch in the Cr(III) plating bath composition without the chromium. The data indicated that a post bake at 190°C (375°F) for 24 hours was necessary in order to pass AMS 2460, 3.4.2 (Bend to Break Test). However, the baking process introduced non-uniformities and pores in the majority of the coatings. Figure 4 shows the effect of surface pretreatments on the porosity and adhesion of the coating in which all, except for the sample lacking additional pretreatments, passed the adhesion test due to the post-deposit bake. Additionally, the deposit with the least observed porosity was formed on a surface that was pretreated with both an anodic electroclean and a reverse etch in the non-Cr bath (pH 2.5).
Performance
Preliminary results have been obtained by plating 51-127 μm (2-5 mils) of chromium from a Cr(III) bath on 1 × 4-inch 4130 normalized steel strips and comparing these deposits performance head-to-head with conventional Cr(VI) deposits. We have successfully demonstrated comparable adhesion (bend break test), corrosion resistance (salt spray), thickness and surface morphology. This behavior is further demonstrated in Figure 5.
Discussion
Faraday has demonstrated the ability to produce chromium coatings, from a Cr(III) bath, that are functionally the same as the coatings produced from conventional Cr(VI) baths, in terms of plate adhesion and corrosion resistance. Future tests are planned to validate the micro-hardness through AMS 2460 3.4.3, the resistance to H2 embrittlement, and the durability under wear and fatigue stresses.
Conclusions
In summary, we are continuing research and development to commercialize our trivalent chromium plating process for functional and decorative applications. We have established the following:
· Plated from a trivalent chromium sulfate bath where the consumable was in the price range of chromic acid,23
· Simplified the bath chemistry using an electrically-mediated waveform,23
· Increased the chromium plating thickness to 250 μm,23
· Maintained a plating rate similar to that of hexavalent chromium,23
· Determined the maximum diffusion layer thickness for plating from atrivalent chromium sulfate bath,24
· Determined the acceptable range for achieving bright plating,24
· Replated chromium on chromium,24
· Showed that the corrosion resistance of trivalent chromium Cr(III)deposits was superior to laser-treated coatings,25
· Constructed a pilot-line plating set-up to plate parts currently used in production to allow commercial evaluation,25
· Achieved a suitable chromium distribution for pump rotor wear tests ata manufacturer,26
· Achieved equal or better wear resistance compared to a Cr(VI) deposit against hardened steel,26
· Demonstrated the capability of the process to deposit chromium onto a bright nickel substrate for bath fixture applications,
· Produced a similar micro-hardness to that of Cr(VI) deposits,
· Developed a technique to deposit thick chromium up to 500 μm (20 mils) with minimal cracking by sequencing the electrical-mediation process parameters.
· Demonstrated a comparable corrosion resistance and plate adhesion to that of Cr(VI) plated samples and
· Developed a surface pretreatment that enhances the deposit quality.
Acknowledgement
This study is supported by the National Center for Manufacturing Sciences (NCMS) and private sources. The financial support of Faraday Technology, Inc. corporate R&D is also gratefully acknowledged.
References
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2. D.J. Hanson, Chemical and Engineering News, June 3, 1991.
3. L. Banker, “Chromium Air Emissions Standards for Hard, Decorative Chromium and Chromium Anodizing,” in Proc. 16th AESF/EPA Conference, Orlando, FL, February, 1995, NASF, Washington, DC, 1995.
4. M.L. Taylor, “Comments Regarding the Chemistry and Health Effects of Chromium (VI) vs. Chromium (III),” Private Research Report, June (2001).
5. H.J. Gibb, et al., Am. J. Ind. Med., 38 (2),115 (2000).
6. G.E. Shahin, Plating & Surface Finishing, 79 (8), 19 (1992).
7. D.L. Snyder, Products Finishing, 61 (8), (August 1989).
8. F. Altmayer, Plating & Surface Finishing, 82 (2), 26 (1995).
9. G. Scott, U.S. Patent 5,196,109 (1993).
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11. J-Y. Hwang, Plating & Surface Finishing, 78 (5), 118, (1991).
12. Z-M. Tu, Z-L. Yang & J-S. Zhang, Plating & Surface Finishing, 77(10), 55 (1990).
13. J. Dash, J. Jin & L. Hotchkiss, Proc. AESF Annual Tech. Conf., SUR-FIN 1991, 78, 947 (1991).
14. Z-M. Tu, et al., Plating & Surface Finishing, 80 (11), 79 (1993).
15. H.Y. Cheh, J. Electrochem. Soc., 118 (4), 551 (1971); 118 (7), 1132 (1971).
16. K. Viswanathan, M.A. Farrell-Epstein & H.Y. Cheh, J. Electrochem. Soc., 125 (11), 1772 (1978).
17. N. Ibl, J.C. Puippe & H. Angerer, Surface Technology, 6 (4), 287 (1978).
18. N. Ibl, Surface Technology, 10 (2) 81 (1980).
19. N. Ibl, Proc. AESF 2nd International Pulse Plating Symposium, NASF, Washington, DC, 1981.
20. D. Landolt, “Mass Transport in Pulse Plating,” in Theory and Practice of Pulse Plating, J.C. Puippe & F. Leaman, Eds.) NASF, Washington, DC, 1986; pp. 55-71.
21. E.J. Taylor, et al., “Electrically Mediated Metallization/Planarization of Semiconductor Substrates, Chip Scale Packages, and High Density Interconnect Printed Wiring Boards,” in Proc. AESF SUR/FIN 2001, NASF, Washington, DC, 2001; pp. 504-510; also Plating & Surface Finishing, 89 (5) 88 (2002).
22. K-M. Yin, Surf. Coat. Technol., 88 (1-3), 162 (1997).
23. R.P. Renz, J.J. Fortman, E.J. Taylor & M.E. Inman, “Effects of Bath Chemistry, Solution Hydrodynamics and Electrical Mediation on Trivalent Chromium Plating,” in Proc. AESF SUR/FIN 2001, NASF, Washington, DC, 2001; pp. 637-645.
24. R.P. Renz, J.J. Fortman, E.J. Taylor & M.E. Inman, “Electrically Mediated Process for Functional Trivalent Chromium to Replace Hexavalent Chromium: Scale-up for Manufacturing Insertion,” in Proc. AESF SUR/FIN 2002, NASF, Washington, DC, 2002; pp. 395-407; alsoPlating & Surface Finishing, 90 (6) 52 (2003).
25. R.P. Renz, J.J. Fortman & E.J. Taylor, “Electrically Mediated Process for Functional Trivalent Chromium to Replace Hexavalent Chromium: Scale-Up for Manufacturing Insertion,” in Proc. AESF SUR/FIN 2003, NASF, Washington, DC, 2003; pp. 330-344.
26. R.P. Renz, J.J. Fortman & E.J. Taylor, “Plating from a Functional Trivalent Chromium Bath to Replace Hexavalent Chromium Plating,” inProc. AESF SUR/FIN 2004, NASF, Washington, DC, 2004; pp. 506-520.
* Corresponding author:
Dr. Timothy D. Hall
Faraday Technology, Inc.
315 Huls Drive
Clayton, OH 45315-8983
Phone: (937) 836-7749
FAX: (937) 836-9498
E-mail: timhall@faradaytechnology.com
**Faradayic® electrodeposition process, Faraday Technology, Inc., Clayton, OH.
About the authors
Dr. Timothy Hall is a Principal Scientist at Faraday Technology, Inc. He received his B.S. degrees from West Virginia University in Chemical Engineering and Mathematics and his doctorate from the University of Notre Dame in Chemical Engineering. Currently, he is working to develop the Faradayic process parameters that lead to functionally graded wear resistance coatings and micro-scale anisotropic etches.
Dr. E. Jennings Taylor uniquely blends 20 years entrepreneurial business experience with demonstrated skills in technology innovation and intellectual asset analysis. Prior to forming Faraday, Dr. Taylor held positions at Giner, Inc. as the Manager of Fuel Cell Research (1982-1985), and at Physical Sciences where he held numerous positions including the Manager of Electrochemical Technologies (1985-1991). In 1991, he left Boston to form Faraday Technology Inc. He successfully secured start-up funding and from 1991-1997 served as the Principal Investigator on many of Faraday’s early research projects. In 1997, Dr. Taylor shifted his emphasis from research to strategic corporate direction and technology portfolio management. In order to facilitate the development of an intellectual property portfolio, he studied to become a Patent Agent and in February, 2003 was granted the status of registered agent with the Patent and Trademark office. He applies this skill to develop patent portfolios that can benefit potential customers. He is well recognized in both the professional and business community and has authored a monthly column on Emerging Technologies of Interest in Plating & Surface Finishing. Dr. Taylor is a Member of the Board of Governors for the Edison Materials Technology Center, holds a position on the Technical Steering Committee of the Society of Manufacturing Engineers/ North American Research Institute, and is a member of the SBIR Advisory Board of the National Science Foundation.
Dr. Maria Inman is the Research Manager at Faraday Technology Inc., where she supervises all R&D activities. She holds a B.E. (Hons.) in metallurgical and materials engineering and a Ph.D. in Materials Engineering from the University of Auckland, New Zealand. Prior to joining Faraday Technology, she completed a two-year term as a post-doctoral research associate at the Center for Electrochemical Science and Engineering at the University of Virginia. She is a member of NASF, NACE and the Electrochemical Society. She is co-inventor on several patents and is the author of numerous technical publications.