The FISCHERSCOPE® X-RAY XDVM®-W is said to be able to measure the coating thickness and alloy composition of virtually any metal coating system. Capable of measuring single, binary and ternary alloy coatings, double coatings, double coatings with one alloy layer and triple coatings, the instrument is suited for high-volume coating thickness measurements on screws, connector contacts, contact strips and PC boards. The system measures according to test method ASTM B568 or DIN 50987 and ISO 3497 respectively. The instrument features a solid sheet metal housing for the measuring chamber and convenient access to the large slotted measuring chamber) that is suitable for both very small and very large specimens.
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