Eastern Applied Research Inc.’s XRF Analyzer Increases Throughput

This analyzer is designed for basic single-layer coating thicknesses and complex multi-layer and alloy thickness applications.

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Eastern Applied Research Inc., Hitachi FT-110A

 

Eastern Applied Research Inc.’s (distributor of Hitachi High-Tech Science Corp.) Hitachi FT-110A X-ray fluorescence (XRF) analyzer is designed for basic single-layer coating thickness and complex multi-layer and alloy thickness applications. The analyzer’s functions are engineered to increase throughput, including high-speed autofocus capabilities, a wide-view observation function for quick identification of testing areas on a large sample and improved standard-less measurement capabilities. Additionally, the analyzers deep mode function maintains accurate, repeatable measurements with crevices 3" in depth.

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