Fischer Technology XRF Device Measures Electroless Nickel Coatings

New Product Announcements From: Products Finishing

Posted on: 6/28/2013

Fischer Technology’s Fischerscope XDV SDD x-ray fluorescence (XRF) instrument is capable of non-destructively measuring the phosphorous content and thickness of electroless nickel coatings simultaneously.

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Fischer Technology’s Fischerscope XDV SDD x-ray fluorescence (XRF) instrument is capable of non-destructively measuring the phosphorous content and thickness of electroless nickel coatings simultaneously. This capability is even possible for vacuum-free measurements in air, regardless of the underlying base material, including aluminum, iron, copper and PCB.

According to the company, measuring the phosphorus content of electroless nickel coatings is critical for determining their corrosion and wear resistance, hardness, and solderability. Fischer’s XRF hardware combined with advanced fundamental parameter software enables fast and accurate results of both phosphorous content and coating thickness at the same time with minimal sample preparation, the company says.

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