Matrix Metrologies will highlight its new XRF film thickness measurement tool, System HMX, a handheld XRF film thickness and composition analysis tool—now with light element sensitivity (Mg, Al, Si, P, S, Cl). The new HMX spectrometer head is evacuated to enhance transmission of the light element, low energy emissions. As in the standard design, it allows the user to take the lab to the process by delivering the speed, power and precision of XRF analysis, wherever and whenever it is needed. The HMX is an XRF solution for measurement of large (even giant) samples. It provides at-process measurement for QC, plating line, and analysis lab applications and at-sample analysis in the factory or in the field along with alloy sorting and alloy identification for substrate materials management.