Matrix Metrologies, a supplier of film measurement and WEEH/RoHS verification equipment, expands the capability of a new X-ray fluorescence (XRF) film thickness measurement tool.
The Matrix HMX, a handheld XRF film thickness and composition analysis instrument, has been improved to include a new RoHS analysis mode that allows restricted element compliance testing on films as well as solids. The HMX provides XRF measurements at the process point. It allows for plating and RoHS screening as well as quantitative determination of thickness, composition and restricted element percentage. In addition, the HMX’s “batch beasurement” mode lets users calculate the average thickness of a batch of small parts with a single measurement. Operators simply point and shoot, and the analyzer automatically generates an average thickness for the entire lot.