New XRF Brochure

New Product Announcements From: Products Finishing

Posted on: 2/11/2009

Matrix Metrologies Inc. introduces a new comprehensive XRF brochure featuring the company’s complete line of bench-top X-ray fluorescence measurement systems designed for metal film thickness and composition measurement of common metal finishing and microelectronics industry plating and coated layers.

Matrix Metrologies Inc. introduces a new comprehensive XRF brochure featuring the company’s complete line of bench-top X-ray fluorescence measurement systems designed for metal film thickness and composition measurement of common metal finishing and microelectronics industry plating and coated layers. Matrix claims the XRF tools are capable of measuring single-, double- and tri-layer coatings as well as alloyed coatings, and are specifically designed for measuring metal finished parts such as fasteners, connectors and machined parts, as well as microelectronics and precious metal finished product.


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