Oxford Instruments’ X-Strata920 x-ray fluorescence (XRF) analyzer combines a large-area proportional detector and the company’s micro-focus x-ray tube to provide a high-intensity, small-spot x-ray beam to measure coating thickness and analyze materials. It produces accurate analysis results in seconds to ensure better process control and cost efficiency, the company says. It is suited for a variety of industries, including electronics, metal finishing, alloys and precious metals assay.
The X-Strata920's multi-point analysis function enables a large sample area to be analyzed in one measurement cycle. If a problem area is identified, the operator can return to specific points with pin-point accuracy for detailed investigation, the company says. The analyzer’s embedded camera and live video imaging ensure precise sample placement.
The X-Strata920 offers a choice of calibration packages tailored for a variety of materials screening applications; it is supplied with more than 800 pre-loaded application parameters/methods. An improved reporting function also enables export to Microsoft Excel and into custom reports, including statistical data analysis and sampling images.
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