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The Element Xr M6 x-ray fluorescence (XRF) analyzer from Eastern Applied Research is designed to enable users to accurately measure a range of coating thicknesses as well as obtain qualitative and quantitative analysis of materials. It is available with three options of detector systems and can be customized for specific testing needs.
The traditional version of the system features a proportional counter detection system and is best suited for standard coating thickness measurements (single-layer, etc.). For more involved thickness needs (thin-film, multi-layer) or quantitative analysis, Si-PIN and Silicon Drift detector technologies are available.
A top-down measurement system, the chamber has an accommodating door that swings open to expose both the front and sides of the interior chamber. It can accommodate large parts and includes a moveable stage platform.