X-ray Instrument Measures Electroless Nickel Coatings on Various Substrates

The instrument can simultaneously measure the phosphorous content and coating layer thickness in electroless nickel.

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K Alpha LLC specializes in X-ray fluorescence (XRF) technology for coating thickness measurement and elemental analysis, offering the Bowman Analytics X-ray System capable of measuring electroless nickel coatings on a variety of substrates. Using hardware and software configured for thin film analysis, the instrument can simultaneously measure the phosphorous content and coating layer thickness in electroless nickel thanks to the enhanced intensity of the phosphorous signal; the signal is correlated with the amount of nickel in the coating layer. The unit can analyze from 0.01 to 50 microns (1 to 2,000 microinches) and phosphorous concentrations between 2 and 14 percent.

K Alpha, call 847-781-3523 or visit kalphaxray.com

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