XRF Analyzer

New Product Announcements From: Products Finishing

Posted on: 9/8/2008

The new X-Strata980 X-ray fluorescence (XRF) instrument combines a high-power X-ray tube and high-resolution detector to measure small areas of complex samples and provide detection limits in single-digit parts per million (ppm). The instrument can analyze and characterize multi-layer coatings and SAC alloys, and provide coating thickness measurement of gold and palladium on electronics, metal alloy chemistry identification and coating thickness measurement on jewelry.

The new X-Strata980 X-ray fluorescence (XRF) instrument combines a high-power X-ray tube and high-resolution detector to measure small areas of complex samples and provide detection limits in single-digit parts per million (ppm). The instrument can analyze and characterize multi-layer coatings and SAC alloys, and provide coating thickness measurement of gold and palladium on electronics, metal alloy chemistry identification and coating thickness measurement on jewelry. Features include a high-resolution detector said to allow easier identification, quantification and differentiation of neighboring elements, complete statistical data functions and a user-programmable display for color coded pass/fail warnings for elements of interest.


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