XRF Analyzer

New Product Announcements From: Products Finishing

Posted on: 5/9/2011

Coating thickness can be accurately measured with a new x-ray fluorescence analyzer, the Element Xr CE-P, available from Eastern Applied Research.

CLICK IMAGE TO ENLARGE (+)

Element Xr CE-P

Element Xr CE-P

Coating thickness can be accurately measured with a new x-ray fluorescence analyzer, the Element Xr CE-P, available from Eastern Applied Research. Using efficient proportional counter detector technology, the CE-P model provides a solution for a wide range of coating measurement needs. Basic, single layer, coatings through complex multi-layer applications can be quickly and accurately measured. Additionally, the it can provide analysis of coating compositions and plating bath solutions. The Element Xr CE-P will be available at a discounted rate during the Sur/Fin exhibition and will be on exhibit for demonstration.

 


Learn More

Editor's Picks

Sur/Fin 2011

The 93rd Annual Sur/Fin, sponsored by The National Association for Surface Finishing, is r...

Related Suppliers

Eastern Applied Research Inc.

Zones

Supplier Categories


Luster-On Products
American Plating Power
Pavco
Technic Inc

Suppliers | Products | Experts | News | Articles | Calendar | Process Zones

The Voice of the Finishing Industry Since 1936 Copyright © Gardner Business Media, Inc. 2014

Subscribe | Advertise | Contact Us | All Rights Reserved