Coating thickness can be accurately measured with a new x-ray fluorescence analyzer, the Element Xr CE-P, available from Eastern Applied Research. Using efficient proportional counter detector technology, the CE-P model provides a solution for a wide range of coating measurement needs. Basic, single layer, coatings through complex multi-layer applications can be quickly and accurately measured. Additionally, the it can provide analysis of coating compositions and plating bath solutions. The Element Xr CE-P will be available at a discounted rate during the Sur/Fin exhibition and will be on exhibit for demonstration.