XRF Analyzer

Coating thickness can be accurately measured with a new x-ray fluorescence analyzer, the Element Xr CE-P, available from Eastern Applied Research.

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Coating thickness can be accurately measured with a new x-ray fluorescence analyzer, the Element Xr CE-P, available from Eastern Applied Research. Using efficient proportional counter detector technology, the CE-P model provides a solution for a wide range of coating measurement needs. Basic, single layer, coatings through complex multi-layer applications can be quickly and accurately measured. Additionally, the it can provide analysis of coating compositions and plating bath solutions. The Element Xr CE-P will be available at a discounted rate during the Sur/Fin exhibition and will be on exhibit for demonstration.

 

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Sur/Fin 2011

The 93rd Annual Sur/Fin, sponsored by The National Association for Surface Finishing, is rolling into the Chicago suburb of Rosemont, Ill., June 13-15. As always, the conference will present state-of-the-art technology and the latest in practical applications for the surface finishing industry. See you there!