XRF Analyzer Optimizes Finishing Productivity

New Product From: Products Finishing,

Posted on: 5/28/2014

Oxford Instruments – Sur/Fin 2014, Booth 320


The X-Strata920 X-ray fluorescence system from Oxford Instruments is designed for quick, accurate and non-destructive analysis of coating and plating processes to help users optimize productivity. It offers thickness measurement of as many as four layers and 15 elements, with automatic correction for X-ray line overlaps and identification covering a range of elements from titanium to uranium.

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