XRF Measuring Instrument Analyzes Thin Coatings, Multi-Coating Systems

The new Fischerscope XDAL-SDD from Fischer Technology determines thin coatings, trace elements and alloys.

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The new Fischerscope XDAL-SDD from Fischer Technology determines thin coatings, trace elements and alloys. The energy dispersive, X-ray fluorescence (XRF) measuring instrument is suited for the analysis of thin coatings less than 0.1 μm (0.004 mils) in the electronics and semiconductor industries. The instrument can be used to determine multi-coating systems, lead content in solder and phosphorous content in NiP coatings.

Features include electrically changeable apertures and primary filters. The modern silicon drift detector achieves a high accuracy and detection sensitivity. Fischer’s fundamental parameter method enables the analysis of solid and liquid specimens as well as coating systems without calibration.

 

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On display at booth 411.

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