XRF Spectrometry Instrument Features Silicon Drift Detector Technology

Eastern Applied Research demonstrates the new Hitachi FT110A X-ray fluorescence spectrometry analyzer for surface finishing quality control.

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Eastern Applied Research demonstrates the new Hitachi FT110A X-ray fluorescence spectrometry analyzer for surface finishing quality control.

The Hitachi FT110A builds on previous models in the line (previously Seiko) including features such as auto-focus and varying accuracy down to 3" into a sample crevice. Additional Hitachi XRF analyzers feature Silicon Drift Detector (SDD) technology, which can provide quantification of phosphorous in electroless nickel and accuracy in ENIG/ENEPIG measurements.

 

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On display at booth 919.

For all exhibition details, conference sessions and event info, go to nasfsurfin.com.

 

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