Oxford Instruments has introduced the PMI-Master Compact mobile spectrometer, a smaller, less expensive version of its PMI-Master Pro metal analyzer.

Oxford Instruments will highlight the new integrated camera on its X-MET7000 that enables users to accurately position the portable analyzer on samples, store images for future reference and include them in the analysis reports.

Eastern Applied Research will demonstrate the Oxford Instruments CMI 730 benchtop coating thickness gage, which is suited for a range of applications, including metal, paint and powder coating thicknesses over a variety of ferrous and non-ferrous substrates.

Oxford Instruments’s X-MET7000 eXpress handheld x-ray fluorescence analyzer is designed to quickly deliver accurate analysis, lower limits of detection and improved precision when measuring trace elements.

Oxford Instruments’ X-Strata920 x-ray fluorescence (XRF) analyzer combines a large-area proportional detector and the company’s micro-focus x-ray tube to provide a high-intensity, small-spot x-ray beam to measure coating thickness and analyze materials.

Oxford Instruments will demonstrate its X-Strata920 x-ray fluorescence analyzer, which is suited for a variety of industries, including electronics, metal finishing, and alloys and precious metals assaying.

The X-MET7500 handheld X-ray fluorescence (XRF) analyzer from Oxford Instruments is designed to analyze a variety of materials, including trace and light elements (from magnesium), without the need for helium purge or a vacuum pump.

Oxford Instruments’ handheld X-ray fluorescence (XRF) analyzer, the X MET7000, provides materials analysis, verification and screening for a variety of industrial markets, including positive material identification, metal recycling, scrap sorting, precious metals analysis, mining and heavy metal screening.

The new X-Strata980 X-ray fluorescence (XRF) instrument combines a high-power X-ray tube and high-resolution detector to measure small areas of complex samples and provide detection limits in single-digit parts per million (ppm). The instrument can analyze and characterize multi-layer coatings and SAC alloys, and provide coating thickness measurement of gold and palladium on electronics, metal alloy chemistry identification and coating thickness measurement on jewelry.

Oxford Instruments has released its new X-Strata980 x-ray fluorescence analyzer, which combines a high-power x-ray tube and large LN2 free detector to measure small areas of complex samples and deliver limits of detection in single digit ppms.

Oxford Instruments Coating Measurement (OICM) will be introducing the Model 150 gage, for the measurement of non-conductive coatings (i.e.

The 200 Series of coating thickness measurement gages feature a unique scanning option that allows the user to continuously measure over large areas with one swift measurement.

The CMI140 is designed for measuring non-conductive coatings such as anodize, paint, enamel, powder coating or epoxy on a non-ferrous substrate such as copper, brass or aluminum.

The CMI 100 Series of gages is said to have provided the industrial coating industry with accuracy, convenient gage size and practicality.

X-ray Fluorescence Brochure featurs the CMI900 Series system, which is said to o0ffer Instant Assay, a fast, accurate, and non-destructive technique to assay gold jewelry, gold karat scrap, precious metals and plated jewelry.

The company will be introducing its smallest coating measurement gage that puts full-size measuring features in the palm of your hand.

The brochure feature sthe CM95, a battery operated handheld gage for measuring copper foil thickness on printed circuit board substrate materials from 1/8-4 oz/ sq ft.