This analyzer is designed for basic single-layer coating thicknesses and complex multi-layer and alloy thickness applications.
Eastern Applied Research – Sur/Fin 2014, Booth 149
Eastern Applied Research offers Oxford Instruments’ X-Strata 920 and 980 x-ray fluorescence analyzers for coating thickness measurement and material analysis.
Eastern Applied Research will demonstrate the Oxford Instruments CMI 730 benchtop coating thickness gage, which is suited for a range of applications, including metal, paint and powder coating thicknesses over a variety of ferrous and non-ferrous substrates.
The Element Xr M6 x-ray fluorescence (XRF) analyzer from Eastern Applied Research is designed to enable users to accurately measure a range of coating thicknesses as well as obtain qualitative and quantitative analysis of materials.
Eastern Applied Research has added the EXr-6000 analyzer to its Element Xr line of x-ray fluorescence technology and will display it at SUR/FIN 2012.
Coating thickness can be accurately measured with a new x-ray fluorescence analyzer, the Element Xr CE-P, available from Eastern Applied Research.
Please visit: Eastern Applied Research Inc.
6614 Lincoln Ave.
Lockport, NY 14094 US