Matrix Metrologies will highlight its new XRF film thickness measurement tool, System HMX, a handheld XRF film thickness and composition analysis tool—now with light element sensitivity (Mg, Al, Si, P, S, Cl).  The new HMX spectrometer head is evacuated to enhance transmission of the light element, low energy emissions.

Matrix Metrologies Inc. introduces a new comprehensive XRF brochure featuring the company’s complete line of bench-top X-ray fluorescence measurement systems designed for metal film thickness and composition measurement of common metal finishing and microelectronics industry plating and coated layers.

Matrix Metrologies Inc. has introduced a new line of XRF tools for compliance testing and monitoring of prohibitive metals for the EU directives RoHS/WEEE for the circuit board and packaging electronics and plating industries.

Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces a new line of XRF tools for compliance testing and monitoring of prohibitive metals for the EU directives RoHS/WEEE for the circuit board and packaging electronics and plating industries.

Matrix Metrologies, a supplier of film measurement and WEEH/RoHS verification equipment, expands the capability of a new X-ray fluorescence (XRF) film thickness measurement tool.

A REVIEW OF AVAILABLE TEST METHODS, COMMON APPLICATIONS AND INNOVATIVE INSTRUMENTATION...

System HMX, is a handheld XRF film thickness and composition analysis tool.

How Will You Do It? X-Ray fluorescence is one alternative

Matrix Metrologies, Inc. will introduce a new portable X-ray analysis tool designed for coating thickness and material analysis measurement of plated parts.

The Company, a supplier of film measurement equipment, has made available a set of eight new XRF technical brochures available in print or email (PDF) form.

The INVOeco is   a low cost universal X-ray analysis system designed for coating thickness and material analysis measurement.

This technical brochure for the Compact 5 X-ray fluorescence coating thickness measurement systems includes information on the compact family of XRF products that is comprised of systems designed exclusively for the metal film measurement needs of the fastener, connector and metal finishing industries.

The X-ray fluorescence coating thickness and composition measurement tool called the HiSpex is designed to measure metal film thickness and compositions along with the determination of elemental composition of solids.

This brochure highlights the GoldCheck, a x-ray assay and precious metals analyzer.

The Compact Eco X-ray fluorescence measurement system designed exclusively for the metal film measurement needs of the metal finishing industry is ideal for measuring parts such as fasteners, connectors and machined parts as well as electrical and precious metal finished products.

The Compact 5 X-ray fluorescence measurement system is designed exclusively for the metal film measurement needs of the metal finishing and microelectronics industries.