Bowman Supplies Goddard Space Flight Center With XRF Technology

At Goddard, the Model P will precisely analyze ENIG, ENEPIG and alloys on printed circuit boards. 

Goddard Space Flight Center, home to Hubble operations and the upcoming James Webb Telescope, has chosen Bowman to supply it with XRF thin film measurement technology.

The Bowman XRF measurement system selected is a Model P, a system with the capability to measure an exceptionally wide range of sample sizes and shapes.  At Goddard, the Model P will precisely analyze ENIG, ENEPIG and alloys on printed circuit boards. 

Goddard engineers have extensive capability for designing and building sensitive instruments; one of the main factors that led to the purchase was Bowman’s IPC 4552A capability and the instrument’s ability to precisely determine phosphorus composition in electroless nickel through the gold layer for incoming PCBs.  Bowman says the Model P measures up to five coating layers simultaneously; in addition to plating thickness measurement, it also performs elemental and solution analysis.

Bowman XRF systems also serve in other NASA facilities, and at Los Alamos National Laboratory, Sandia National Lab, and the Department of Defense Repair Center. Visit www.bowmanxrf.com