The Voice of the Finishing Industry since 1936

  • PF Youtube
  • PF Facebook
  • PF Twitter
  • PF LinkedIn
4/1/2016

Bruker’s M2 Blizzard Analyzes PCBs

Facebook Share Icon LinkedIn Share Icon Twitter Share Icon Share by EMail icon Print Icon

The slotted sample chamber and the large tray are designed to support fast and exact positioning of all types of PCBs.

Share

Facebook Share Icon LinkedIn Share Icon Twitter Share Icon Share by EMail icon Print Icon
�

Bruker, M2 Blizzard XRF

 

Bruker’s slotted M2 Blizzzard small-spot X-ray fluorescence (XRF) spectrometer is designed for nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray are designed to support exact positioning of all PCB types, from small to oversized, that extend the sample chamber. 

Related Topics

RELATED CONTENT

Resources