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4/1/2016

Fischer Technology’s Fischerscope Measures Thin Coatings

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The company says this instrument is well-suited for non-destructive measurements and analyzing thin coatings, even with complex compositions or small concentrations.

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Fischer Technology, Fischerscope XDAL-SDD

 

Fischer Technology’s Fischerscope XDAL-SDD is an energy dispersive X-ray flurorescesnce measuring instrument engineered to determine thin coatings, trace elements and alloys. The company says this instrument is designed for non-destructive measurements and analyzing thin coatings, even with complex compositions or small concentrations. The instrument is engineered to measure functional coatings for electronic and semiconductor applications. With electrically changeable apertures and primary filters, and a modern silicon drift detector, this instrument is designed for high accuracy and good detection sensitivity.

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