Share
Hitachi FT160 XRF analyzer
Hitachi High-Tech Analytical Science’s FT160 XRF analyzer has three base configurations for analyzing nanometer-scale coatings on small features. The unit is a benchtop energy dispersive X-ray fluorescence analyzer designed to deliver high sample throughput with a wide range of applications in the semiconductor, circuit board and electronics components markets. According to the company, a polycapillary optic focuses the X-ray beam down to a diameter of <30 µm, focusing more intensity on the sample and measuring features smaller than what is possible with traditional collimation. It is said that a high-precision stage and high-definition camera with digital zoom allow for quick positioning of the sample features to improve sample throughput.
Related Topics
RELATED CONTENT
-
2020 Vision: The Future of Coatings
The year 2020 will be here before you know it, signaling the beginning of a new decade and bringing changes to the world as we know it.
-
The Importance of Particle Size in Liquid Coatings
Coating problems and solutions associated with particle size reduction...
-
Masking for Surface Finishing
Masking is employed in most any metal finishing operation where only a specifically defined area of the surface of a part must be exposed to a process. Conversely, masking may be employed on a surface where treatment is either not required or must be avoided. This article covers the many aspects of masking for metal finishing, including applications, methods and the various types of masking employed.
