Sensofar 3D Optical Profiler Designed for Speed
Microscope designed for subnano, nano and microscale measurement.
Sensofar Metrology’s 5th-generation optical profiler, S neox, is a noncontact, 3D optical profiler microscope system designed for subnano, nano and microscale measurement with advanced inspection and analysis capabilities. The company says the S neox is engineered for speed with unique algorithms enabling data acquisition taken at 180 fps and standard measurement acquisition 5X faster than the previous model.
The S neox design has been updated in terms of flexibility, stability and durability required for both R&D and QC laboratories, according to the company. It is able to work in QC environments and can be programmed to work 24/7. Its sensor head features confocal, interferometry and Ai focus variation options.
The company says other features include an active illumination focus variation for measuring the shape of large rough surfaces; thin film measurement that allows users to measure the thickness of optically transparent layers quickly, accurately, nondestructively and with no sample preparation; differential interference contrast (DIC) to emphasize very small height features that have no contrast in regular observation; and high dynamic range (HDR) to mitigate reflection and dropout points on highly reflective surfaces.
Masking is employed in most any metal finishing operation where only a specifically defined area of the surface of a part must be exposed to a process. Conversely, masking may be employed on a surface where treatment is either not required or must be avoided. This article covers the many aspects of masking for metal finishing, including applications, methods and the various types of masking employed.
Types of anodizing, processes, equipment selection and tank construction.
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