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6/26/2019

Sensofar 3D Optical Profiler Designed for Speed

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Microscope designed for subnano, nano and microscale measurement.

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Sensofar Metrology’s 5th-generation optical profiler, S neox, is a noncontact, 3D optical profiler microscope system designed for subnano, nano and microscale measurement with advanced inspection and analysis capabilities. The company says the S neox is engineered for speed with unique algorithms enabling data acquisition taken at 180 fps and standard measurement acquisition 5X faster than the previous model.

The S neox design has been updated in terms of flexibility, stability and durability required for both R&D and QC laboratories, according to the company. It is able to work in QC environments and can be programmed to work 24/7. Its sensor head features confocal, interferometry and Ai focus variation options.

The company says other features include an active illumination focus variation for measuring the shape of large rough surfaces; thin film measurement that allows users to measure the thickness of optically transparent layers quickly, accurately, nondestructively and with no sample preparation; differential interference contrast (DIC) to emphasize very small height features that have no contrast in regular observation; and high dynamic range (HDR) to mitigate reflection and dropout points on highly reflective surfaces.

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