Measurement System Quantifies Coating Thickness, Offers Elemental Analysis
Smaller measurement system quantifies coating thickness and offers elemental analysis for labs and production lines.
Bowman, a U.S. manufacturer of XRF quality control instruments, has added a G Series to their suite of benchtop XRF plating measurement systems to use for coating thickness and solution analysis.
This series is is designedfor jewelry, connectors, components (such as fasteners) and other precious metals analysis as it quantifies zinc, zinc-nickel and other anti-corrosion coatings.
Two features of the G Series are “bottom-up” measurement (using a motorized Z-axis with laser-based autofocus), and precision video imaging. An available manual XY stage with 1.5” x 1.5” travel facilitates positioning of small and large parts, according to the company.
The standard configuration includes a single-fixed collimator, solid-state PIN detector, and long-life microfocus X-ray tube. As with all Bowman models, the components can be upgraded to include multiple collimators, variable focal camera or SDD detector.
These instruments simultaneously measure up to five coating layers and 10 elements in each layer for a total of 25 elements. Element range is Al (13) through U (92.)
To quantify coating thickness from the detected photons, these systems run Xralizer software, which combines controls with timesaving shortcuts, search capability, and “one-click” reporting. The software also allows creation of new applications by the user. and includes full-access instruments from the day of install. There are no dongles or lockouts to complicate, delay or add cost.
This product was developed for both labs and production environments, and may beadvantageous for users with limited benchtop space or budget limitations.
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