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6/29/2012

UPA Technology X-Ray Instrument Measures Coating Thickness

Originally titled 'X-Ray Instrument Measures Coating Thickness'
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UPA Technology’s XRF-2000 x-ray coating thickness gage is available in three chamber versions to measure parts ranging from small connectors to large plated parts and even circuit boards.

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UPA Technology’s XRF-2000 x-ray coating thickness gage is available in three chamber versions to measure parts ranging from small connectors to large plated parts and even circuit boards.

Features include laser focusing, point and measure, easy-to-load sample stages, and plating bath analysis. The gage’s software is designed to be user-friendly with drop-down menus and a Microsoft-based operating system that enables direct transfer of measurement date to Excel. Operators can review and print from five standard report formats for color-enhanced graphics, statistics and measurement data. The systems shut off the XRF tube between measurements, increasing x-ray tube life and eliminating the need for mechanical shutters. 

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