X-Rite Announces Imaging Spectrophotometer for Delivering Consistently Colored Part

X-Rite Inc. (Grand Rapids, Michigan) has announced the launch of the CiF3200 imaging spectrophotometer designed for color measurement of small, odd-shaped, multicolored and highly reflective items. 

With a minimum measurement area of 2 mm, the CiF3200 enables manufacturers to set and communicate digital color standards for small components, improving quality control and reducing rework. It supports applications where detail, consistency and accuracy are needed, including luxury goods, consumer electronics and plastic components.

The CiF3200 combines several advanced features, including virtual apertures ranging from 2-12 mm, on-screen targeting for precise sample alignment and automatic multicolor extraction to deliver fast, repeatable color measurements and support objective, data-driven evaluation.

The CiF3200 sphere benchtop spectrophotometer offers simultaneous SPIN/SPEX capability. The spectrophotometer enables users to set and communicate digital color standards for small or complex components; verify each measurement spot with live on-screen targeting; capture and store measurement images for traceability; and extract multiple colors from a single sample for comprehensive analysis.