Webinar Description:
This webinar examines the broad range of techniques available to characterize thin film materials with an emphasis on physical, mechanical, optical, thermal, electrical and magnetic characterization. We examine the range of properties of interest and how thin film properties may differ from bulk properties.
Characterization techniques for optical properties such as ellipsometry, reflectance, interferometry and optical scattering are considered. Characterization of thermal properties by micro-thermal microscopy and thermal diffusion measurements are presented.
Techniques for determining electrical and magnetic properties are also discussed. These include resistance using four point probe and van der Pauw methods, Hall effect, and Magneto-optical Kerr effect. The emphasis here is on materials characterization as opposed to device characterization.
The tutorial concludes with an examination of techniques used to explore mechanical properties such as stress-curvature measurements, friction testing, micro/nano indentation and adhesion tests.
Topical Outline:
Overview of wide range of characterization techniques for thin films including:
•Optical properties (reflectance, ellipsometry, light scattering, interferometry)
•Thermal properties (micro-thermal microscopy, thermal diffusion measurement)
•Electrical properties (resistance, Hall effect)
•Magnetic properties (Magneto-optical Kerr effect)
•Mechanical properties (Brillouin Light Scattering, stress-curvature, friction, micro/nano indentation, adhesion)
Pricing for Live Webinars:
Member $325 | Nonmember: $400 | Student: $200
Special Offer: Attend W-332-A and Receive 30% off Webinar W-332-B when registering for the second webinar.
